A one-stop test house in Europe for cost-effective test solutions
Test program development with focus on quality
DELTA’s team is completely aware of your time-to-market challenge and therefore has developed formal procedures for test development projects over many years to ensure clients high quality and rigorous test solutions.
We manage the test solution development and debug activities by coordination with your project schedule to help you deliver tested components to your customer on time. This ensures your product a faster time-to-market.
Test production with focus on timely deliveries
DELTA has invested heavily in our semiconductor testing resources, and operates one of the largest commercially available microelectronics testing facilities in Europe. We have a variety of equipment to suit different applications, and thus have the ability to optimise the test solution to the application (in the most optimal way).
ASIC to COT business model
DELTA’s focus on support of our customer’s success range from prototype through production setup and ramp-up to high volume production ensuring the right business model at every phase of the product\’s life cycle.
- Test Program Development (TPD)
- Production test
- Qualification, environmental and burn-in test
- Failure, material and technology analysis
- Consulting test specification, test optimisation
Test solutions since 1976
DELTA has over 30 years of extensive experience in semiconductor testing and provides all testing services required for ICs, from wafer test, through qualification testing, to the final production test of packaged devices.
DELTA’s ASIC Test Centre was founded by industry pioneers in testing technology. The company’s portfolio speaks to the experience of our team and our deep understanding of ASIC testing technology. Our team has demonstrated over 500 complete, fully functional and optimised test solutions since 1976.
Our mission is to provide best-in-class services with sharp focus on developing the most optimised solution in terms of quality and test time.