Test experience

DELTA started its semiconductor test centre in 1976 and today operates one of the largest commercial microelectronics testing facilities in Europe

Our highly-skilled staff takes care of the complete range of development and semiconductor testing processes: from wafers, to qualification testing, through to the final functional test of packaged devices.

Our very large investment in ATE (Automatic Test Equipment) and capital equipment for VLSI (Very Large Scale Integration) testing allows us to handle analogue, digital and mixed signal technology components.

1000 test programs

With such a long track record, we have experience of creating testing strategies for almost every type of semiconductor technology and have developed approaching 1000 device test programmes.

The work ranges from digital chips with as many as 1600 pins, through quality programs for some of today’s most complex wireless and mixed signal devices operating at frequencies up to 6 GHz, to ultra high speed wired and fibre components with communication data rates up to 10 Gbits/second.

From thousands to millions devices per year

At DELTA’s VLSI test facility in Denmark, we undertake testing typically for volumes ranging from thousands to millions of devices/year (at the packaged device level).

However, we also provide turnkey solutions to clients with higher volume requirements, by using the services of our assembly house partners in the Asia Pacific region.

Let us tailor our services to your needs

DELTA is extremely flexible, and our test services can be tailored to support you on any level, from consultancy on test strategy or test development, to complete life cycle testing services for an IC. Our know-how will not only help you to optimise the quality of the IC, but also minimise the cost of the testing process, and reduce your time to market or project completion.

“DELTA’s proven expertise and experience in testing and qualification of ICs for wireless applications ensures a very rapid and secure path to qualified volume production for our WLAN products.”

— Pär Bergsten

CEO, Nanoradio

Our test equipment

Automated Test Equipment (ATE)

2 pcs. Teradyne Catalyst Mixed Signal Testing for advanced ASICs/High Pin Count

Teradyne J750 VLSI Digital Testing for High Pin Count (320 pins) and RFID-option

Advantest V93000 Double Density (PS800, 608 dig. pins) with Postscale RF option & mixed signal instruments

Advantest V93000 Double Density (PS1600, 256 dig. Pins) with mixed signal instruments

Wafer probers

TSK/ACCRETECH UF3000, 8″ and 12″ wafers

TSK-90A upgraded to UF200 hot chuck

TSK-90A upgraded to UF200

2 pcs. TSK UF200 AL with hot chuck

2 pcs. TSK UF200 SA with hot chuck

Component handlers

We handle DIL, PLCC, QFP, SO, BGA, TSOP, LCC, MLP, QFN and other package types:

3 pcs. MultiTest MT9510 – Ambient pick & place handler

3 pcs. MultiTest MT9928 Ambient / Hot gravity handler

Other test equipment

Dynamic burn-in chamber

Temperature cycling chamber

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